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relates: Total ionizing dose effects in 130-nm commercial CMOS technologies for HEP experiments

524702
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relates: Total ionizing dose effects in 130-nm commercial CMOS technologies for HEP experiments

RDF description of Total ionizing dose effects in 130-nm commercial CMOS technologies for HEP experiments - http://irises.unibg.it/resource/item/24646
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date: 2026-08-19T05:25:56
publisher: Total ionizing dose effects in 130-nm commercial CMOS technologies for HEP experiments
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Total ionizing dose effects in 130-nm commercial CMOS technologies for HEP experiments
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