Document
type: Class

Academic Article
type: Class

1519015
type: Entity
type: BFO_0000020
type: Authorship
type: Relationship
type: Continuant
type: Thing
relates: Characterization of bulk damage in CMOS MAPS with Deep N-Well collecting electrode

Continuant
type: Class

Entity
type: Class

Generically Dependent Continuant
type: Class

Article
type: Class

Inglese
type: Language

Information Content Entity
type: Class

Characterization of bulk damage in CMOS MAPS with Deep N-Well collecting electrode
language: Inglese
type: Continuant
type: Thing
type: Academic Article
type: Generically Dependent Continuant
type: Article
most specific type: Academic Article
type: Document
type: Information Content Entity
type: Entity
related by: 1519015

RDF description of Characterization of bulk damage in CMOS MAPS with Deep N-Well collecting electrode - http://irises.unibg.it/resource/item/33396
rights: termsOfUse
date: 2026-08-19T04:43:20
publisher: Characterization of bulk damage in CMOS MAPS with Deep N-Well collecting electrode
type: Document