Study of Single Event transients on the VELA ASIC, x-ray detectors FEE for new generation astronomical instruments

It is well known that the use of electronics components in space exposes them to ionizing radiation, which can damage the devices. A careful characterization of the sensitivity to radiation-induced damages is thus of capital importance for the critical devices. VELA (VLSI Electronic for Astronomy) is an ASIC developed at the Politecnico of Milano in collaboration with Max-Planck-Institut Semiconductor Laboratory, in 0.35 Jim AMS CMOS technology, which implements the readout front-end electronics for an innovative xray detector, the DEPMOS-based APS, Active Pixel Sensor. This sensor is capable of providing an excellent energy resolution even at very high speed readout. The absence of the charge transfer mechanism, makes APS sensors very attractive for harsh radiation space environments. The behavior of the front-end electronics under irradiation is then a critical issue. We present a study of the Single Event Effects induced by heavy ions in VELA, in view of a possible utilization in new generation satellites for xray astronomy. The tests have been carried out at the SIRAD facility of the Laboratori Nazionali INFN di Legnaro. In this paper we describe the measurements and the experimental setup, designed and realized ad hoc to monitor Single Event Latch-up (SEL) and Single Event Upset (SEU).