Characterisation of a pixel sensor in SOI technology for charged particle tracking

Academic Article

Publication Date:

2011

Short description:

(2011). Characterisation of a pixel sensor in SOI technology for charged particle tracking [journal article - articolo]. In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. Retrieved from http://hdl.handle.net/10446/187060

abstract:

This paper presents the results of the characterisation of a pixel sensor manufactured in SOI technology integrated on a high-resistivity substrate, and featuring several pixel cell layouts for charge collection optimisation. The sensor is tested with short IR laser pulses, X-rays and 200 GeV pions. We report results on charge collection, particle detection efficiency and single point resolution.

Iris type:

1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays

List of contributors:

Battaglia, Marco; Bisello, Dario; Contarato, Devis; Denes, Peter; Giubilato, Piero; Mattiazzo, Serena; Pantano, Devis; Zalusky, Sarah

Handle:

https://aisberg.unibg.it/handle/10446/187060

Published in:

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT

Journal

Research

Concepts

Academic field (2000 version)

Settore FIS/01 - Fisica Sperimentale

Characterisation of a pixel sensor in SOI technology for charged particle tracking

Battaglia, Marco; Bisello, Dario; Contarato, Devis; Denes, Peter; Giubilato, Piero; Mattiazzo, Serena; Pantano, Devis; Zalusky, Sarah

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT

Research

Concepts