IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Journal

Identifier:

E079943

ISSN:

0018-9499

Overview

Outputs (76)

65-nm CMOS Front-End Channel for Pixel Readout in the HL-LHC Radiation Environment

Academic Article

A 1 Grad TID-Tolerant Bandgap Voltage Reference for HEP applications in 28 nm CMOS node

Academic Article

A 32-Channel Readout ASIC for X-Ray Spectrometry and Tracking in the GAPS Experiment

Academic Article

A 65 nm Rad-Hard Bandgap Voltage Reference for LHC Environment

Academic Article

A 65-nm CMOS Prototype Chip With Monolithic Pixel Sensors and Fast Front-End Electronics

Academic Article

A Front-End Channel in 65 nm CMOS for Pixel Detectors at the HL-LHC Experiment Upgrades

Academic Article

Analog Readout Channel for Continuous-Wave X-Ray Science Applications

Academic Article

Assessment of a low-power 65 nm CMOS technology for analog front-end design

Academic Article

CMOS MAPS in a homogeneous 3D process for charged particle tracking

Academic Article

Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs

Academic Article

Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs

Academic Article

Characterization of a 28 nm CMOS Technology for Analog Applications in High Energy Physics

Academic Article

Characterization of bulk damage in CMOS MAPS with Deep N-Well collecting electrode

Academic Article

Charge signal processors in a 130 nm CMOS technology for the sparse readout of small pitch monolithic and hybrid pixel sensors

Academic Article

Comparison of Ionizing Radiation Effects in 0.18 and 0.25 um CMOS Technologies for Analog Applications

Academic Article

Comprehensive study of total ionizing dose damage mechanisms and their effects on noise sources in a 90 nm CMOS technology

Academic Article

Dark Count Rate Degradation in CMOS SPADs Exposed to X-Rays and Neutrons

Academic Article

Design and performance of a DNW CMOS Active Pixel Sensor for the ILC vertex detector

Academic Article

Design of Time Invariant Analog Front-End Circuits for Deep N-Well CMOS MAPS

Academic Article

Design optimization of charge preamplifiers with CMOS processes in the 100 nm gate length regime

Academic Article

Development of the DEPFET Sensor With Signal Compression: A Large Format X-Ray Imager With Mega-Frame Readout Capability for the European XFEL

Academic Article

Drain Current Collapse in 65 nm pMOS Transistors After Exposure to Grad Dose

Conference Paper

Dynamic Compression of the Signal in a Charge Sensitive Amplifier: Experimental Results

Academic Article

Dynamic compression of the signal in a charge sensitive amplifier: from concept to design

Academic Article

Editorial Conference Comments by the Editors

Academic Article

Effects of Interface Donor Trap States on Isolation Properties of Detectors Operating at High-Luminosity LHC

Academic Article

Effects of gamma-rays on JFET devices and circuits fabricated in a detector-compatible process

Academic Article

Effects of substrate thinning on the properties of quadruple well CMOS MAPS

Academic Article

Enhancement of Transistor-to-Transistor Variability Due to Total Dose Effects in 65-nm MOSFETs

Academic Article

Experimental study and modeling of the white noise sources in submicron P- and N-MOSFETs

Academic Article

FSSR2, a self-triggered low noise readout chip for silicon strip detectors

Academic Article

Fermilab silicon strip readout chip for BTeV

Academic Article

Front-end performance and charge collection properties of heavily irradiated DNW MAPS

Academic Article

Gate Current Noise in Ultrathin Oxide MOSFETs and Its Impact on the Performance of Analog Front-End Circuits

Academic Article

Heavily irradiated 65-nm readout chip with asynchronous channels for future pixel detectors

Academic Article

IEEE Transactions on Nuclear Science: Symposium on radiation measurements and applications (SORMA WEST 2012), Oakland (CA), USA, May 14-17, 2012

Edited Book

Impact of lateral isolation oxides on radiation-induced noise degradation in CMOS technologies in the 100-nm regime

Academic Article

Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses

Academic Article

Initial test results of an ionization chamber shower detector for a LHC luminosity monitor

Academic Article

Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers

Academic Article

Investigating Degradation Mechanisms in 130 nm and 90 nm Commercial CMOS Technologies Under Extreme Radiation Conditions

Academic Article

Investigation of Supply Current Spikes in Flash Memories Using Ion-Electron Emission Microscopy

Academic Article

Ion Impact Detection and Micromapping With a SDRAM for IEEM Diagnostics and Applications

Academic Article

Ionizing Radiation Effects of 3 Grad TID on Analog and Noise Performance of 28nm CMOS Technology

Academic Article

Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels

Academic Article

JFET front-end circuits integrated in a detector-grade silicon substrate

Academic Article

Low-Noise Analog Channel for the Readout of the Si(Li) Detector of the GAPS Experiment

Academic Article

Mechanisms of Noise Degradation in Low Power 65 nm CMOS Transistors Exposed to Ionizing Radiation

Academic Article

Modeling charge loss in CMOS MAPS exposed to non-ionizing radiation

Academic Article

Monolithic pixel sensors for fast silicon vertex trackers in a quadruple well CMOS technology

Academic Article

Noise analysis of NPN SOI bipolar transistors for the design of charge measuring systems

Academic Article

Noise behavior of a 180 nm CMOS SOI technology for detector front-end electronics

Academic Article

Noise performance of 0.13 µm CMOS technologies for detector front-end applications

Academic Article

On-Chip Fast Data Sparsification for a Monolithic 4096-Pixel Device

Academic Article

Operational Experience with the GEM Detector Assembly Lines for the CMS Forward Muon Upgrade

Academic Article

Optimization of signal extraction and front-end design in a fast, multigap ionization chamber

Academic Article

Optimization of the 65-nm CMOS Linear Front-End Circuit for the CMS Pixel Readout at the HL-LHC

Academic Article

Performance, radiation damage, and future plans of the BaBar silicon vertex tracker

Academic Article

Pixel-Level charge and current injection circuit for high accuracy calibration of the DSSC Chip at the European XFEL

Academic Article

Proton-induced damage in JFET transistors and charge preamplifiers on high-resistivity silicon

Academic Article

Quadruple well CMOS MAPS with time-invariant processor exposed to ionizing radiation and neutrons

Academic Article

Qualification and Integration Aspects of the DSSC Mega-Pixel X-Ray Imager

Academic Article

Radiation hardness perspectives for the design of analog detector readout circuits in the 0.18-um CMOS generation

Academic Article

Radiation tolerance of devices and circuits in a 3D technology based on the vertical integration of two 130-nm CMOS layers

Academic Article

Resolution limits in 130 nm and 90 nm CMOS technologies for analog front-end applications

Academic Article

Response of SOI bipolar transistors exposed to gamma-rays under different dose rate and bias conditions

Academic Article

Signal and Noise Performance of a 110-nm CMOS Technology for Photon Science Applications

Academic Article

Submicron CMOS technologies for low-noise analog front-end Circuits

Academic Article

Survey of noise performances and scaling effects in deep submicrometer CMOS devices from different foundries

Academic Article

TID effects in deep N-well CMOS monolithic active pixel sensors

Academic Article

TID-Induced Degradation in Static and Noise Behavior of Sub-100 nm Multifinger Bulk NMOSFETs

Academic Article

The MiniSDD-Based 1-Mpixel Camera of the DSSC Project for the European XFEL

Academic Article

Total Dose Effects on a FD-SOI Technology for Monolithic Pixel Sensors

Academic Article

Total ionizing dose effects on the noise performances of a 0.13 /spl mu/m CMOS technology

Academic Article

Trends in the design of spectroscopy amplifiers for room temperature solid state detectors

Academic Article

X-ray and Particle Detection with the Si(Li) Tracker Module of the GAPS Experiment

Academic Article

No Results Found

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Overview

Outputs (76)