TID-Induced Degradation in Static and Noise Behavior of Sub-100 nm Multifinger Bulk NMOSFETs

... IEEE TRANSACTIONS ON NUCLEAR SCIENCE. Ratti, Lodovico; Gaioni, Luigi; Manghisoni, Massimo; Re, Valerio; Traversi, Gianluca. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. http://ieeexplore.ieee.org/xpl/RecentIssue.jsp? ...

CMOS MAPS in a homogeneous 3D process for charged particle tracking

... The radiation hardness study of the technology will also be presented together with its impact on 3D DNW MAPS performance.. RE Valerio. GAIONI Luigi. MANGHISONI Massimo. TRAVERSI Gianluca ...

Characterization of bulk damage in CMOS MAPS with Deep N-Well collecting electrode

... This paper discusses the measurement results and their relation with the bulk damage mechanisms underlying performance degradation in DNW MAPS. TRAVERSI Gianluca ...

Quadruple well CMOS MAPS with time-invariant processor exposed to ionizing radiation and neutrons

... This work discusses the test results, obtained through different measurement techniques, and the mechanisms underlying performance degradation in irradiated quadruple well CMOS MAPS.. TRAVERSI Gianluca ...

Charge signal processors in a 130 nm CMOS technology for the sparse readout of small pitch monolithic and hybrid pixel sensors

... 2011. Traversi, Gianluca. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. http://ieeexplore.ieee.org/servlet/opac? ...

Monolithic pixel sensors for fast silicon vertex trackers in a quadruple well CMOS technology

... Finally, selected results from a neutron irradiation campaign with fluences up to 2.7× 10^13 1 MeV neutron equivalent/cm^2 will be shown.. TRAVERSI Gianluca. GAIONI Luigi. RE Valerio ...

Assessment of a low-power 65 nm CMOS technology for analog front-end design

... IEEE TRANSACTIONS ON NUCLEAR SCIENCE. Manghisoni, Massimo; Gaioni, Luigi; Ratti, Lodovico; Re, Valerio; Traversi, Gianluca. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. http://ieeexplore.ieee.org/xpl/RecentIssue.jsp? ...

Modeling charge loss in CMOS MAPS exposed to non-ionizing radiation

... The consistency between the model and the measurement results seems to confirm that radiation induced increase in the recombination rate is the main source of charge collection degradation in neutron-irradiated MAPS.. GAIONI Luigi. TRAVERSI Gianluca ...

Effects of substrate thinning on the properties of quadruple well CMOS MAPS

... Later on, results from measurements relevant to the thinned chips both in terms of analog front-end channel performance and charge collection properties will be shown and compared to those from non-thinned chips.. TRAVERSI Gianluca. MANGHISONI Massimo. RE Valerio ...