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Design and test of a 65nm CMOS front-end with zero dead time for next generation pixel detectors

Conference Paper
Publication Date:
2018
Short description:
(2018). Design and test of a 65nm CMOS front-end with zero dead time for next generation pixel detectors . In POS PROCEEDINGS OF SCIENCE. Retrieved from http://hdl.handle.net/10446/129958
abstract:
This work is concerned with the experimental characterization of a synchronous analog processor with zero dead time developed in a 65 nm CMOS technology, conceived for pixel detectors at the HL-LHC experiment upgrades. It includes a low noise, fast charge sensitive amplifier with detector leakage compensation circuit, and a compact, single ended comparator able to correctly process hits belonging to two consecutive bunch crossing periods. A 2-bit Flash ADC is exploited for digital conversion immediately after the preamplifier. A description of the circuits integrated in the front-end processor and the initial characterization results are provided.
Iris type:
1.4.01 Contributi in atti di convegno - Conference presentations
List of contributors:
Gaioni, Luigi; Braga, D.; Christian, D.; Deptuch, G.; Fahim, F.; Nodari, Benedetta; Ratti, L.; Re, Valerio; Zimmerman, T.
Authors of the University:
GAIONI Luigi
RE Valerio
Handle:
https://aisberg.unibg.it/handle/10446/129958
Full Text:
https://aisberg.unibg.it/retrieve/handle/10446/129958/276037/TWEPP-17_021-1.pdf
Book title:
Proceedings, Topical Workshop on Electronics for Particle Physics (TWEPP17) : Santa Cruz, CA, USA, September 11-15, 2017
Published in:
POS PROCEEDINGS OF SCIENCE
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Settore ING-INF/01 - Elettronica
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