Tests of monolithic pixel detectors in SOI technology with depleted substrate

Articolo
Data di Pubblicazione:
2011
Citazione:
(2011). Tests of monolithic pixel detectors in SOI technology with depleted substrate [journal article - articolo]. In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. Retrieved from http://hdl.handle.net/10446/187068
Abstract:
This paper reviews the R&D program on monolithic pixel sensors in silicon-on-insulator technology carried out by LBNL, the University and INFN, Padova and SCIPP-UCSC. The main issues addressed by the R&D, back-gating and radiation tolerance, are discussed together with the preliminary results from the characterization of the latest chip in this technology.
Tipologia CRIS:
1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays
Elenco autori:
Giubilato, Piero; Battaglia, Marco; Bisello, Dario; Contarato, Devis; Denes, Peter; Sung Kim, Tae; Mattiazzo, Serena; Pantano, Devis; Pozzobon, Nicola; Tindall, C. S.; Zalusky, Sarah
Link alla scheda completa:
https://aisberg.unibg.it/handle/10446/187068
Pubblicato in:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Journal

Ricerca

Settori


Settore FIS/01 - Fisica Sperimentale