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Tests of monolithic pixel detectors in SOI technology with depleted substrate

Academic Article
Publication Date:
2011
Short description:
(2011). Tests of monolithic pixel detectors in SOI technology with depleted substrate [journal article - articolo]. In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. Retrieved from http://hdl.handle.net/10446/187068
abstract:
This paper reviews the R&D program on monolithic pixel sensors in silicon-on-insulator technology carried out by LBNL, the University and INFN, Padova and SCIPP-UCSC. The main issues addressed by the R&D, back-gating and radiation tolerance, are discussed together with the preliminary results from the characterization of the latest chip in this technology.
Iris type:
1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays
List of contributors:
Giubilato, Piero; Battaglia, Marco; Bisello, Dario; Contarato, Devis; Denes, Peter; Sung Kim, Tae; Mattiazzo, Serena; Pantano, Devis; Pozzobon, Nicola; Tindall, C. S.; Zalusky, Sarah
Handle:
https://aisberg.unibg.it/handle/10446/187068
Published in:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
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