Publication Date:
2015
Short description:
(2015). 65 nm Technology for HEP: Status and Perspective . In POS PROCEEDINGS OF SCIENCE. Retrieved from http://hdl.handle.net/10446/84100
abstract:
The development of new experiments such as CLIC and the the foreseen Phase 2 pixel upgrades of ATLAS and CMS have very challenging requirements for the design of hybrid pixel readout chips, both in terms of performances and reliability. To face these challenges, the use of a more downscaled CMOS technology compared to previous projects is necessary. The CERN RD53 collaboration is undertaking a R&D programme to evaluate the use of a commercial 65 nm technology and to develop tools and frameworks which will help to design future pixel detectors. This paper gives a short overview of the RD53 collaboration activities and describes some examples of recent developments.
Iris type:
1.4.01 Contributi in atti di convegno - Conference presentations
List of contributors:
Barbero, M. B.; Fougeron, D.; Gensolen, F.; Godiot, S.; Mmenouni, M.; Pangaud, P.; Rozanov, A.; Wang, A.; Bomben, M.; Calderini, G.; Crescioli, F.; Genat, J-F.; Le Dortz, O.; Marchiori, G.; Dzahini, D.; Rarbi, F. E.; Gaglione, R.; Gonella, L.; Themperek, T.; Huegging, F.; Karagounis, M.; Kishishita, T.; Krueger, H.; Rymaszewski, P.; Wermes, N.; Ciciriello, F.; Corsi, F.; Licciulli, F.; Marzocca, C.; De Robertis, G.; Loddo, F.; Tamma, C.; Andreazza, A.; Liberali, V.; Shojaii, S.; Stabile, A.; Bagatin, M.; Bisello, D.; Mattiazzo, Serena; Ding, L.; Gerardin, S.; Giubilato, P.; Neviani, A.; Paccagnella, A.; Vogrig, D.; Wyss, N.; Bacchetta, N.; De Canio, F.; Gaioni, Luigi; Nodari, B.; Manghisoni, Massimo; Re, Valerio; Traversi, Gianluca; Comotti, D.; Ratti, L.; Vacchi, C.; Beccherle, R.; Bellazini, R.; Magazzu, G.; Minuti, M.; Morsani, F.; Palla, F.; Fanucci, L.; Rizzi, A.; Saponara, S.; Androsov, K.; Bilei, G. M.; Menichelli, M.; Conti, E.; Marconi, S.; Passeri, D.; Placidi, P.; Della Casa, G.; Demaria, N.; Mazza, G.; Rivetti, A.; Da Rocha Rolo, M. D.; Monteil, E.; Pacher, L.; Gajanana, D.; Gromov, V.; Hessey, N.; Kluit, R.; Zivkovic, V.; Havranek, M.; Janoska, Z.; Marcisovsky, M.; Neue, G.; Tomasek, L.; Kafka, V.; Sicho, P.; Vrba, V.; Vila, I.; Aguirre, M. A.; MunĚoz, P.; Palomo, F. R.; Abbaneo, D.; Christiansen, J.; Dannheim, D.; Dobos, D.; Linssen, L.; Pernegger, H.; Valerio, P.; Alipour Tehrani, N.; Bell, S.; Prydderch, M. L.; Thomas, M.; Christian, D. C.; Deptuch, G.; Fahim, F.; Hoff, J.; Lipton, R.; Liu, L.; Zimmerman, R.; Garcia-Sciveres, M.; Gnani, D.; Mekkaoui, A.; Gorelov, I.; Hoeferkamp, M.; Seidel, S.; Toms, K.; De Witt, J. N.; Grillo, Alexander A.
Book title:
Vertex2014 - The 23rd International Workshop on Vertex Detectors, 15-19 September 2014, Macha Lake, The Czech Republic
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