Evaluation of the radiation tolerance of 65 nm CMOS devices for high-density front-end electronics

... They also provide criteria for the design of high-density, rad-hard analog front-end circuits.. RE Valerio. TRAVERSI Gianluca. GAIONI Luigi. MANGHISONI Massimo ...

Review of radiation effects leading to noise performance degradation in 100-nm scale microelectronic technologies

... Modeling of radiation effects in these devices is used to define rad-hard design criteria.. TRAVERSI Gianluca. RE Valerio. GAIONI Luigi. MANGHISONI Massimo ...

High accuracy injection circuit for pixel-level calibration of readout electronics

... The aim of the paper is to discuss the design guidelines for the calibration circuit and to present the relevant simulation results of the developed system which will be implemented in a 130 nm CMOS technology.. MANGHISONI Massimo. TRAVERSI Gianluca ...

Non-standard approach to charge signal processing in CMOS MAPS for charged particle trackers

... 2005. Ratti, Lodovico; Manghisoni, Massimo; Re, Valerio; Speziali, Valeria; Traversi, Gianluca. IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD. 1.4.01 Contributi in atti di convegno - Conference presentations. 2005 IEEE Nuclear Science Symposium Conference Record. https://hdl.handle.net/10446/86497. (2005). ...

An asynchronous front-end channel for pixel detectors at the HL-LHC experiment upgrades

... Retrieved from http://hdl.handle.net/10446/78343. GAIONI Luigi. MANGHISONI Massimo. RE Valerio. TRAVERSI Gianluca ...

Low-noise fast charge sensitive amplifier with dynamic signal compression

... Retrieved from http://hdl.handle.net/10446/79582. MANGHISONI Massimo. GAIONI Luigi. RE Valerio. TRAVERSI Gianluca ...

CMOS monolithic sensors in a homogeneous 3D process for low energy particle imaging

... Ratti, Lodovico; Caccia, Massimo; Gaioni, Luigi; Manazza, Alessia; Manghisoni, Massimo; Re, Valerio; Traversi, Gianluca; Zucca, Stefano. 2011. 1.4.01 Contributi in atti di convegno - Conference presentations. ...

Discriminators in 65 nm CMOS process for high granularity, high time resolution pixel detectors

... 2013. Ratti, Lodovico; Manghisoni, Massimo; Re, Valerio; Traversi, Gianluca. IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD. (2013). Discriminators in 65 nm CMOS process for high granularity, high time resolution pixel detectors [conference presentation - intervento a convegno]. ...

JFET front-end circuits integrated in a detector-grade silicon substrate

... IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD. Manghisoni, Massimo; Ratti, L.; Re, Valerio; Speziali, V.; Traversi, Gianluca; Dalla Betta, G. F.; Boscardin, M.; Batignani, G.; Giorgi, M.; Bosisio, L.. ...

Noise Characterization of 130 nm and 90 nm CMOS Technologies for Analog Front-end Electronics

... Manghisoni, Massimo; Ratti, L.; Re, Valerio; Speziali, V.; Traversi, Gianluca. 2006. IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD. 1.4.01 Contributi in atti di convegno - Conference presentations. 2006 IEEE Nuclear Sscience Symposium Conference Record. https://hdl.handle.net/10446/86494. (2006). ...