Analog front-end for pixel sensors in a 3D CMOS technology for the SuperB Layer0

... 2011. IL NUOVO CIMENTO C. Manazza, Alessia; Gaioni, Luigi; Ratti, Lodovico; Traversi, Gianluca; Zucca, Stefano; Re, Valerio. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. https://hdl.handle.net/10446/26025. ...

A 65-nm CMOS Prototype Chip With Monolithic Pixel Sensors and Fast Front-End Electronics

... IEEE TRANSACTIONS ON NUCLEAR SCIENCE. Gaioni, Luigi; Manghisoni, Massimo; Ratti, Lodovico; Re, Valerio; Traversi, Gianluca. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. https://hdl.handle.net/10446/27966. ...

A Time-over-Threshold based analog front-end in 28 nm CMOS for pixel detectors in future colliders

... Retrieved from https://hdl.handle.net/10446/281290. GAIONI Luigi. RE Valerio. TRAVERSI Gianluca ...

Development and Testing of a Miniaturized Platform for Photoplethysmography

... Moreover, an investigation of the best body measurement location has been assessed.. TRAVERSI Gianluca. GAIONI Luigi ...

Monolithic Active Pixel Sensors for the vertex detector at the International Linear Collider

... In this chip, named SDR0 (Sparsified Digital Readout), for the first time we implemented a sparsification logic at the pixel level.. MANGHISONI Massimo. RE Valerio. TRAVERSI Gianluca ...

Radiation effects on the noise parameters of a 0.18 mu m CMOS technology for detector front-end applications

... Manghisoni, Massimo; Ratti, Lodovico; Traversi, Gianluca. 2003. NUCLEAR PHYSICS B-PROCEEDINGS SUPPLEMENTS. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. https://hdl.handle.net/10446/117947. (2003). ...

Noise analysis of NPN SOI bipolar transistors for the design of charge measuring systems

... For this purpose, a method for optimizing the noise performances of charge measuring systems has been applied to the experimental data from single device characterization.. TRAVERSI Gianluca. RE Valerio. MANGHISONI Massimo ...

Mechanisms of Noise Degradation in Low Power 65 nm CMOS Transistors Exposed to Ionizing Radiation

... IEEE TRANSACTIONS ON NUCLEAR SCIENCE. Re, Valerio; Gaioni, Luigi; Manghisoni, Massimo; Ratti, Lodovico; Traversi, Gianluca. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. https://hdl.handle.net/10446/24234. ...

TID-Induced Degradation in Static and Noise Behavior of Sub-100 nm Multifinger Bulk NMOSFETs

... IEEE TRANSACTIONS ON NUCLEAR SCIENCE. Ratti, Lodovico; Gaioni, Luigi; Manghisoni, Massimo; Re, Valerio; Traversi, Gianluca. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. http://ieeexplore.ieee.org/xpl/RecentIssue.jsp? ...

Impact of lateral isolation oxides on radiation-induced noise degradation in CMOS technologies in the 100-nm regime

... IEEE TRANSACTIONS ON NUCLEAR SCIENCE. Re, Valerio; Manghisoni, Massimo; Traversi, Gianluca; Ratti, Lodovico; Speziali, Valeria. 2007. 1.1.01 Articoli/Saggi in rivista - Journal Articles/Essays. https://hdl.handle.net/10446/21370. ...